Imaging atomic motion of light elements in 2D materials with 30 kV electron microscopy

  • Sytze de Graaf (Contributor)
  • Majid Ahmadi (Contributor)
  • I. Lazić (Contributor)
  • E.G.T. Bosch (Contributor)
  • Bart Kooi (Contributor)

Dataset

Description

This dataset contains part of the experimental and simulated 30 kV scanning transmission electron microscopy (STEM) images of 2D WS2, using in particular simultaneously integrated differential phase contrast (iDPC)-STEM and annular dark-field (ADF)-STEM.
Date made available12-Oct-2021
PublisherDataverseNL

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