Engineering
Casimir Force
100%
Correlation Length
73%
Thin Films
66%
Actuation
50%
Roughness Effect
44%
Electrostatics
35%
Atomic Force Microscopy
32%
Stiction
26%
Length Scale
26%
Microelectromechanical System
23%
Room Temperature
22%
Nanoparticle
21%
Nanometre
21%
Scanning Tunneling Microscopy
21%
Quality Factor
19%
Roughness Parameter
19%
Transmissions
19%
Chaotic Motion
18%
Lifshitz Theory
18%
Nanoscale
18%
Dielectrics
17%
Random Rough Surface
17%
Energy Engineering
15%
Phase Change Material
14%
Crystalline Phase
14%
Dispersion Force
13%
Double Layer
12%
Pull-in Voltage
11%
Nonequilibrium
11%
Roughness Ratio
11%
Gas-Phase
11%
Nanoclusters
10%
Conductive
10%
Capillary Force
10%
Microsystem
10%
Friction Coefficient
9%
Momentum Exchange
9%
Coefficient of Friction
9%
Dielectric Function
9%
Root Mean Square
9%
Square Roughness
8%
Phase Portrait
8%
Correlation Model
8%
Induced Roughness
8%
Frequency Shift
8%
Electrical Conductivity
8%
Good Agreement
8%
Fractal Surface
7%
Two Dimensional
7%
Contact Area
7%
Material Science
Film
81%
Surface Roughness
80%
Thin Films
58%
Rough Surface
58%
Nanoparticle
56%
Optical Property
38%
Amorphous Material
25%
Dielectric Material
23%
Nanoclusters
22%
Oxidation Reaction
21%
Phase Change Material
19%
Film Thickness
19%
Transmission Electron Microscopy
18%
Crystalline Material
18%
Electrical Conductivity
16%
Nucleation
15%
Cobalt
15%
Oxide Compound
14%
Microelectromechanical System
13%
Silicide
12%
Nanocrystalline Material
12%
Thermal Stability
10%
Annealing
9%
Silicon
9%
Contact Angle
9%
Coefficient of Friction
9%
Capacitance
9%
Electron Microscopy
8%
Thick Films
8%
Hydrodynamics
8%
High-Resolution Transmission Electron Microscopy
8%
Magnesium
7%
Surface Morphology
7%
Gas Phase Synthesis
7%
Contact Area
7%
Dielectric Property
7%
Silver
7%
Inert Gas
7%
Nanowire
7%
Wettability
7%
Magnesium Oxide
6%
Conductor
6%
Density
6%
Desorption
6%
Semiconducting Film
6%
Metallic Films
6%
Quantum Well
5%
Molybdenum
5%
Conductive Material
5%
Grain Boundary
5%
Keyphrases
Casimir Force
15%
Roughness Exponent
10%
Correlation Length
8%
Self-affine Roughness
8%
Actuation Behavior
7%
Random Rough Surface
5%
Electric Double Layer
5%
Roughness Amplitude
5%
Van Der Waals
5%