A non-conservative software-based approach for detecting illegal CFEs caused by transient faults

Diego Rodrigues, Ghazaleh Nazarian, Álvaro Moreira, Luigi Carro, Georgi Gaydadjiev

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Abstract

Software-based methods for the detection of control-flow errors caused by transient fault usually consist in the introduction of protecting instructions both at the beginning and at the end of basic blocks. These methods are conservative in nature, in the sense that they assume that all blocks have the same probability of being the target of control flow errors. Because of that assumption they can lead to a considerable increase both in memory and performance overhead during execution time. In this paper, we propose a static analysis that provide a more refined information about which basic blocks can be the target of control-flow-errors caused by single-bit flips. This information can then be used to guide a program transformation in which only susceptible blocks have to be protected. We implemented the static analysis and program transformation in the context of the LLVM framework and performed an extensive fault injection campaign. Our experiments show that this less conservative approach can potentially lead to gains both in memory usage and in execution time while keeping high fault coverage.

Original languageEnglish
Title of host publicationProceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages221-226
Number of pages6
ISBN (Electronic)9781509003129
DOIs
Publication statusPublished - 2-Nov-2015
Externally publishedYes
Event28th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015 - Amherst, United States
Duration: 12-Oct-201514-Oct-2015

Publication series

NameProceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015

Conference

Conference28th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015
Country/TerritoryUnited States
CityAmherst
Period12/10/201514/10/2015

Keywords

  • and service-ability
  • availability
  • Fault tolerance
  • Reliability

Cite this