A Technical Introduction to Transmission Electron Microscopy for Soft-Matter: Imaging, Possibilities, Choices, and Technical Developments

  • Linda E Franken
  • , Kay Grünewald
  • , Egbert J Boekema
  • , Marc C A Stuart*
  • *Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

108 Citations (Scopus)
697 Downloads (Pure)

Abstract

With a significant role in material sciences, physics, (soft matter) chemistry, and biology, the transmission electron microscope is one of the most widely applied structural analysis tool to date. It has the power to visualize almost everything from the micrometer to the angstrom scale. Technical developments keep opening doors to new fields of research by improving aspects such as sample preservation, detector performance, computational power, and workflow automation. For more than half a century, and continuing into the future, electron microscopy has been, and is, a cornerstone methodology in science. Herein, the technical considerations of imaging with electrons in terms of optics, technology, samples and processing, and targeted soft materials are summarized. Furthermore, recent advances and their potential for application to soft matter chemistry are highlighted.

Original languageEnglish
Article number1906198
Number of pages15
JournalSmall
Volume16
Issue number14
Early online date2020
DOIs
Publication statusPublished - 1-Apr-2020

Keywords

  • contrast
  • (cryo) transmission electron microscopy
  • focused ion beam milling
  • image formation
  • soft-matter
  • STIMULI-RESPONSIVE NANOCARRIERS
  • BEAM-INDUCED MOTION
  • CRYO-EM
  • CRYOELECTRON MICROSCOPY
  • LIFT-OUT
  • SUPRAMOLECULAR CHEMISTRY
  • 3-DIMENSIONAL STRUCTURE
  • MOLECULAR INFORMATION
  • SAMPLE PREPARATION
  • PHASE-CONTRAST

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