A Theoretical Model for Capturing the Impact of Design Patterns on Quality: The Decorator Case Study

Sofia Charalampidou; Apostolus Ampatzoglou; Paris Avgeriou; Seren Sencer; Elvira-Maria Arvanitou; Ioannis Stamelos

doi:10.1145/3019612.3019781

A Theoretical Model for Capturing the Impact of Design Patterns on Quality: The Decorator Case Study

Sofia Charalampidou, Apostolus Ampatzoglou, Paris Avgeriou, Seren Sencer, Elvira-Maria Arvanitou, Ioannis Stamelos

Software Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

13 Downloads (Pure)

Original language	English
Title of host publication	Proceedings of the Symposium on Applied Computing
Place of Publication	New York, NY, USA
Publisher	ACM Press
Pages	1231-1238
Number of pages	8
ISBN (Print)	978-1-4503-4486-9
DOIs	https://doi.org/10.1145/3019612.3019781
Publication status	Published - 2017

Publication series

Name	SAC '17
Publisher	ACM

Keywords

design metrics, design patterns, software quality

Access to Document

10.1145/3019612.3019781

A theoretical model for capturing the impact of design patterns on quality: the decorator case studyFinal publisher's version, 804 KBLicence: Taverne

Cite this

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title = "A Theoretical Model for Capturing the Impact of Design Patterns on Quality: The Decorator Case Study",

keywords = "design metrics, design patterns, software quality",

author = "Sofia Charalampidou and Apostolus Ampatzoglou and Paris Avgeriou and Seren Sencer and Elvira-Maria Arvanitou and Ioannis Stamelos",

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doi = "10.1145/3019612.3019781",

language = "English",

isbn = "978-1-4503-4486-9",

series = "SAC '17",

publisher = "ACM Press",

pages = "1231--1238",

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}

A Theoretical Model for Capturing the Impact of Design Patterns on Quality : The Decorator Case Study. / Charalampidou, Sofia; Ampatzoglou, Apostolus; Avgeriou, Paris; Sencer, Seren; Arvanitou, Elvira-Maria; Stamelos, Ioannis.

Proceedings of the Symposium on Applied Computing. New York, NY, USA : ACM Press, 2017. p. 1231-1238 (SAC '17).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Ampatzoglou, Apostolus

AU - Avgeriou, Paris

AU - Sencer, Seren

AU - Arvanitou, Elvira-Maria

AU - Stamelos, Ioannis

PY - 2017

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KW - design metrics, design patterns, software quality

U2 - 10.1145/3019612.3019781

DO - 10.1145/3019612.3019781

M3 - Conference contribution

SN - 978-1-4503-4486-9

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EP - 1238

BT - Proceedings of the Symposium on Applied Computing

PB - ACM Press

CY - New York, NY, USA

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