TY - GEN
T1 - A Theoretical Model for Capturing the Impact of Design Patterns on Quality
T2 - The Decorator Case Study
AU - Charalampidou, Sofia
AU - Ampatzoglou, Apostolus
AU - Avgeriou, Paris
AU - Sencer, Seren
AU - Arvanitou, Elvira-Maria
AU - Stamelos, Ioannis
PY - 2017
Y1 - 2017
KW - design metrics, design patterns, software quality
U2 - 10.1145/3019612.3019781
DO - 10.1145/3019612.3019781
M3 - Conference contribution
SN - 978-1-4503-4486-9
T3 - SAC '17
SP - 1231
EP - 1238
BT - Proceedings of the Symposium on Applied Computing
PB - ACM Press
CY - New York, NY, USA
ER -