A Theoretical Model for Capturing the Impact of Design Patterns on Quality: The Decorator Case Study

Sofia Charalampidou; Apostolus Ampatzoglou; Paris Avgeriou; Seren Sencer; Elvira-Maria Arvanitou; Ioannis Stamelos

doi:10.1145/3019612.3019781

A Theoretical Model for Capturing the Impact of Design Patterns on Quality: The Decorator Case Study

Sofia Charalampidou, Apostolus Ampatzoglou, Paris Avgeriou, Seren Sencer, Elvira-Maria Arvanitou, Ioannis Stamelos

Software Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the Symposium on Applied Computing
Place of Publication	New York, NY, USA
Publisher	ACM Press
Pages	1231-1238
Number of pages	8
ISBN (Print)	978-1-4503-4486-9
DOIs	https://doi.org/10.1145/3019612.3019781
Publication status	Published - 2017

Publication series

Name	SAC '17
Publisher	ACM

Keywords

design metrics, design patterns, software quality

Access to Document

10.1145/3019612.3019781

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A theoretical model for capturing the impact of design patterns on quality: the decorator case study
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Cite this

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title = "A Theoretical Model for Capturing the Impact of Design Patterns on Quality: The Decorator Case Study",

keywords = "design metrics, design patterns, software quality",

author = "Sofia Charalampidou and Apostolus Ampatzoglou and Paris Avgeriou and Seren Sencer and Elvira-Maria Arvanitou and Ioannis Stamelos",

year = "2017",

doi = "10.1145/3019612.3019781",

language = "English",

isbn = "978-1-4503-4486-9",

series = "SAC '17",

publisher = "ACM Press",

pages = "1231--1238",

booktitle = "Proceedings of the Symposium on Applied Computing",

}

A Theoretical Model for Capturing the Impact of Design Patterns on Quality : The Decorator Case Study. / Charalampidou, Sofia; Ampatzoglou, Apostolus; Avgeriou, Paris; Sencer, Seren; Arvanitou, Elvira-Maria; Stamelos, Ioannis.

Proceedings of the Symposium on Applied Computing. New York, NY, USA : ACM Press, 2017. p. 1231-1238 (SAC '17).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Ampatzoglou, Apostolus

AU - Avgeriou, Paris

AU - Sencer, Seren

AU - Arvanitou, Elvira-Maria

AU - Stamelos, Ioannis

PY - 2017

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KW - design metrics, design patterns, software quality

U2 - 10.1145/3019612.3019781

DO - 10.1145/3019612.3019781

M3 - Conference contribution

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BT - Proceedings of the Symposium on Applied Computing

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CY - New York, NY, USA

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