Accelerated ion beams for in-beam e-gamma spectroscopy

JS Dionisio*, C Vieu, C Schuck, R Meunier, D Ledu, A Lafoux, JM Lagrange, M Pautrat, B Waast, WR Phillips, BJ Varley, JL Durell, PG Dagnall, SJ Dorning, M. A. JONES, AG Smith, JCS Bacelar, T Rzaca-Urban, H Folger, J VanhorenbeeckW Urban

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

A few accelerated ion beam requirements for in-beam e-gamma spectroscopy are briefly reviewed as well as several features of the MP Tandem accelerator of IPN-Orsay and the accelerated ion-beam transport devices leading to the experimental area of in-beam e-gamma spectroscopy. In particular, the main capabilities of the ion-sources, the ion pulsing system, the ion stripping and stabilizing devices as well as the versatility of the ion beam transport system are discussed from the point of view of the different kinds of in-beam e-gamma experiments performed in that area. (C) 1998 Elsevier Science B.V. All rights reserved.

Original languageEnglish
Pages (from-to)59-73
Number of pages15
JournalNuclear instruments & methods in physics research section a-Accelerators spectrometers detectors and associated equipment
Volume413
Issue number1
Publication statusPublished - 11-Aug-1998

Keywords

  • ion beams
  • electron spectrometers
  • low-energy e-gamma measurements
  • ELECTRON-SPECTRA
  • EXCITED-LEVELS
  • TARGET PROPERTIES
  • NUCLEI

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