Amorphous AlN films grown by ALD from trimethylaluminum and monomethylhydrazine

Roman G. Parkhomenko*, Oreste De Luca, Łukasz Kołodziejczyk, Evgeny Modin, Petra Rudolf, Diego Martínez Martínez, Luis Cunha, Mato Knez

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

7 Citations (Scopus)
217 Downloads (Pure)

Abstract

The great interest in aluminium nitride thin films has been attributed to their excellent dielectric, thermal and mechanical properties. Here we present the results of amorphous AlN films obtained by atomic layer deposition. We used trimethylaluminum and monomethylhydrazine as the precursors at a deposition temperature of 375-475 °C. The structural and mechanical properties and chemical composition of the synthesized films were investigated in detail by X-ray diffraction, X-ray photoelectron spectroscopy, electron and probe microscopy and nanoindentation. The obtained films were compact and continuous, exhibiting amorphous nature with homogeneous in-depth composition, at an oxygen content of as low as 4 at%. The mechanical properties were comparable to those of AlN films produced by other techniques.

Original languageEnglish
Pages (from-to)15062-15070
Number of pages9
JournalDalton Transactions
Volume50
Issue number42
DOIs
Publication statusPublished - 14-Nov-2021

Fingerprint

Dive into the research topics of 'Amorphous AlN films grown by ALD from trimethylaluminum and monomethylhydrazine'. Together they form a unique fingerprint.

Cite this