TY - GEN
T1 - Automatic image segmentation using a deformable model based on charged particles
AU - Jalba, Andrei C.
AU - Wilkinson, Michael H.F.
AU - Roerdink, Jos B.T.M.
N1 - Relation: http://www.rug.nl/informatica/organisatie/overorganisatie/iwi
Rights: University of Groningen. Research Institute for Mathematics and Computing Science (IWI)
PY - 2004
Y1 - 2004
N2 - We present a method for automatic segmentation of grey-scale images, based on a recently introduced deformable model, the charged-particle model (CPM). The model is inspired by classical electrodynamics and is based on a simulation of charged particles moving in an electrostatic field. The charges are attracted towards the contours of the objects of interest by an electrostatic field, whose sources are computed based on the gradient-magnitude image. Unlike the case of active contours, extensive user interaction in the initialization phase is not mandatory, and segmentation can be performed automatically. To demonstrate the reliability of the model, we conducted experiments on a large database of microscopic images of diatom shells. Since the shells are highly textured, a post-processing step is necessary in order to extract only their outlines.
AB - We present a method for automatic segmentation of grey-scale images, based on a recently introduced deformable model, the charged-particle model (CPM). The model is inspired by classical electrodynamics and is based on a simulation of charged particles moving in an electrostatic field. The charges are attracted towards the contours of the objects of interest by an electrostatic field, whose sources are computed based on the gradient-magnitude image. Unlike the case of active contours, extensive user interaction in the initialization phase is not mandatory, and segmentation can be performed automatically. To demonstrate the reliability of the model, we conducted experiments on a large database of microscopic images of diatom shells. Since the shells are highly textured, a post-processing step is necessary in order to extract only their outlines.
M3 - Conference contribution
SN - 3-540-23223-0
T3 - LECTURE NOTES IN COMPUTER SCIENCE
SP - 1
EP - 8
BT - IMAGE ANALYSIS AND RECOGNITION, PT 1, PROCEEDINGS
A2 - Campilho, A
A2 - Kamel, M
PB - University of Groningen, Johann Bernoulli Institute for Mathematics and Computer Science
CY - BERLIN
T2 - International Conference on Image Analysis and Recognition
Y2 - 29 September 2004 through 1 October 2004
ER -