Celebrating 40 years of panel data analysis: Past, present and future

Vasilis Sarafidis; Tom Wansbeek

doi:10.1016/j.jeconom.2020.06.001

Celebrating 40 years of panel data analysis: Past, present and future

Vasilis Sarafidis^*, Tom Wansbeek

^*Corresponding author for this work

Economics, Econometrics and Finance

Research output: Contribution to journal › Editorial › Academic

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Abstract

The present special issue features a collection of papers presented at the 2017 International Panel Data Conference, hosted by the University of Macedonia in Thessaloniki, Greece. The conference marked the 40th anniversary of the inaugural International Panel Data Conference, which was held in 1977 at INSEE in Paris, under the auspices of the French National Centre for Scientific Research. As a collection, the papers appearing in this special issue of the Journal of Econometrics continue to advance the analysis of panel data, and paint a state-of-the-art picture of the field. (c) 2020 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	215-226
Number of pages	12
Journal	Journal of Econometrics
Volume	220
Issue number	2
Early online date	25-Jun-2020
DOIs	https://doi.org/10.1016/j.jeconom.2020.06.001
Publication status	Published - Feb-2021

Keywords

Panel data analysis
Unobserved heterogeneity
Omitted variables
Cross-sectional dependence
Dynamic relationships
Temporal effects
Aggregation bias
Nonlinear models
Incidental parameter problem
Common factor models
Multi-dimensional data
Multi-level data
TESTING SLOPE HOMOGENEITY
REGRESSION-MODELS
BIAS REDUCTION
DYNAMIC-MODELS
LINEAR-MODELS
CROSS-SECTION
TIME-SERIES
IDENTIFICATION
HETEROGENEITY
SPECIFICATION

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title = "Celebrating 40 years of panel data analysis: Past, present and future",

abstract = "The present special issue features a collection of papers presented at the 2017 International Panel Data Conference, hosted by the University of Macedonia in Thessaloniki, Greece. The conference marked the 40th anniversary of the inaugural International Panel Data Conference, which was held in 1977 at INSEE in Paris, under the auspices of the French National Centre for Scientific Research. As a collection, the papers appearing in this special issue of the Journal of Econometrics continue to advance the analysis of panel data, and paint a state-of-the-art picture of the field. (c) 2020 Elsevier B.V. All rights reserved.",

keywords = "Panel data analysis, Unobserved heterogeneity, Omitted variables, Cross-sectional dependence, Dynamic relationships, Temporal effects, Aggregation bias, Nonlinear models, Incidental parameter problem, Common factor models, Multi-dimensional data, Multi-level data, TESTING SLOPE HOMOGENEITY, REGRESSION-MODELS, BIAS REDUCTION, DYNAMIC-MODELS, LINEAR-MODELS, CROSS-SECTION, TIME-SERIES, IDENTIFICATION, HETEROGENEITY, SPECIFICATION",

author = "Vasilis Sarafidis and Tom Wansbeek",

year = "2021",

month = feb,

doi = "10.1016/j.jeconom.2020.06.001",

language = "English",

volume = "220",

pages = "215--226",

journal = "Journal of Econometrics",

issn = "0304-4076",

publisher = "Elsevier Science",

number = "2",

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T1 - Celebrating 40 years of panel data analysis

T2 - Past, present and future

AU - Sarafidis, Vasilis

AU - Wansbeek, Tom

PY - 2021/2

Y1 - 2021/2

N2 - The present special issue features a collection of papers presented at the 2017 International Panel Data Conference, hosted by the University of Macedonia in Thessaloniki, Greece. The conference marked the 40th anniversary of the inaugural International Panel Data Conference, which was held in 1977 at INSEE in Paris, under the auspices of the French National Centre for Scientific Research. As a collection, the papers appearing in this special issue of the Journal of Econometrics continue to advance the analysis of panel data, and paint a state-of-the-art picture of the field. (c) 2020 Elsevier B.V. All rights reserved.

AB - The present special issue features a collection of papers presented at the 2017 International Panel Data Conference, hosted by the University of Macedonia in Thessaloniki, Greece. The conference marked the 40th anniversary of the inaugural International Panel Data Conference, which was held in 1977 at INSEE in Paris, under the auspices of the French National Centre for Scientific Research. As a collection, the papers appearing in this special issue of the Journal of Econometrics continue to advance the analysis of panel data, and paint a state-of-the-art picture of the field. (c) 2020 Elsevier B.V. All rights reserved.

KW - Panel data analysis

KW - Unobserved heterogeneity

KW - Omitted variables

KW - Cross-sectional dependence

KW - Dynamic relationships

KW - Temporal effects

KW - Aggregation bias

KW - Nonlinear models

KW - Incidental parameter problem

KW - Common factor models

KW - Multi-dimensional data

KW - Multi-level data

KW - TESTING SLOPE HOMOGENEITY

KW - REGRESSION-MODELS

KW - BIAS REDUCTION

KW - DYNAMIC-MODELS

KW - LINEAR-MODELS

KW - CROSS-SECTION

KW - TIME-SERIES

KW - IDENTIFICATION

KW - HETEROGENEITY

KW - SPECIFICATION

U2 - 10.1016/j.jeconom.2020.06.001

DO - 10.1016/j.jeconom.2020.06.001

M3 - Editorial

SN - 0304-4076

VL - 220

SP - 215

EP - 226

JO - Journal of Econometrics

JF - Journal of Econometrics

IS - 2

ER -

Celebrating 40 years of panel data analysis: Past, present and future

Abstract

Keywords

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