Characterization of electromigration-induced gold nanogaps

S.J. van der Molen; M.L. Trouwborst; D. Dulic; B.J. van Wees

Characterization of electromigration-induced gold nanogaps

S.J. van der Molen, M.L. Trouwborst, D. Dulic, B.J. van Wees

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

We study the formation and. stability of nanometer-sized gaps, created by electromigration, in thin gold wires. After a wire breaks due to a high local current density, nanogaps of random size are found, all exhibiting tunneling behavior at low bias. Surprisingly, we find that small gaps (<appr. 0.5 nm) can be closed again when a voltage of about 2 V is applied. For larger gaps this is not possible, but the gold does become unstable, leading to an apparent negative differential resistance. We relate these effects to field evaporation and field-enhanced diffusion, respectively.

Original language	English
Title of host publication	Host Publication
Editors	H Kuzmany, J Fink, M Mehring, S Roth
Place of Publication	MELVILLE
Publisher	AMER INST PHYSICS
Pages	511-515
Number of pages	5
Volume	685
ISBN (Print)	0-7354-0154-3
Publication status	Published - 2003
Event	17th International Winterschool/Euroconference on Electronic Properties of Novel Materials - , Austria Duration: 8-Mar-2003 → 15-Mar-2003

Publication series

Name	AIP CONFERENCE PROCEEDINGS
Publisher	AMER INST PHYSICS
Volume	685
ISSN (Print)	0094-243X

Other

Other	17th International Winterschool/Euroconference on Electronic Properties of Novel Materials
Country/Territory	Austria
Period	08/03/2003 → 15/03/2003

Keywords

SCANNING-TUNNELING-MICROSCOPY
ELECTRODES

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@inproceedings{2baf0cbf5c17463c8170cd52ff35bb66,

title = "Characterization of electromigration-induced gold nanogaps",

abstract = "We study the formation and. stability of nanometer-sized gaps, created by electromigration, in thin gold wires. After a wire breaks due to a high local current density, nanogaps of random size are found, all exhibiting tunneling behavior at low bias. Surprisingly, we find that small gaps (",

keywords = "SCANNING-TUNNELING-MICROSCOPY, ELECTRODES",

author = "{van der Molen}, S.J. and M.L. Trouwborst and D. Dulic and {van Wees}, B.J.",

year = "2003",

language = "English",

isbn = "0-7354-0154-3",

volume = "685",

series = "AIP CONFERENCE PROCEEDINGS",

publisher = "AMER INST PHYSICS",

pages = "511--515",

editor = "H Kuzmany and J Fink and M Mehring and S Roth",

booktitle = "Host Publication",

note = "17th International Winterschool/Euroconference on Electronic Properties of Novel Materials ; Conference date: 08-03-2003 Through 15-03-2003",

}

van der Molen, SJ, Trouwborst, ML, Dulic, D & van Wees, BJ 2003, Characterization of electromigration-induced gold nanogaps. in H Kuzmany, J Fink, M Mehring & S Roth (eds), Host Publication. vol. 685, AIP CONFERENCE PROCEEDINGS, vol. 685, AMER INST PHYSICS, MELVILLE, pp. 511-515, 17th International Winterschool/Euroconference on Electronic Properties of Novel Materials, Austria, 08/03/2003.

Characterization of electromigration-induced gold nanogaps. / van der Molen, S.J.; Trouwborst, M.L.; Dulic, D. et al.
Host Publication. ed. / H Kuzmany; J Fink; M Mehring; S Roth. Vol. 685 MELVILLE: AMER INST PHYSICS, 2003. p. 511-515 (AIP CONFERENCE PROCEEDINGS; Vol. 685).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Characterization of electromigration-induced gold nanogaps

AU - van der Molen, S.J.

AU - Trouwborst, M.L.

AU - Dulic, D.

AU - van Wees, B.J.

PY - 2003

Y1 - 2003

N2 - We study the formation and. stability of nanometer-sized gaps, created by electromigration, in thin gold wires. After a wire breaks due to a high local current density, nanogaps of random size are found, all exhibiting tunneling behavior at low bias. Surprisingly, we find that small gaps (

AB - We study the formation and. stability of nanometer-sized gaps, created by electromigration, in thin gold wires. After a wire breaks due to a high local current density, nanogaps of random size are found, all exhibiting tunneling behavior at low bias. Surprisingly, we find that small gaps (

KW - SCANNING-TUNNELING-MICROSCOPY

KW - ELECTRODES

M3 - Conference contribution

SN - 0-7354-0154-3

VL - 685

T3 - AIP CONFERENCE PROCEEDINGS

SP - 511

EP - 515

BT - Host Publication

A2 - Kuzmany, H

A2 - Fink, J

A2 - Mehring, M

A2 - Roth, S

PB - AMER INST PHYSICS

CY - MELVILLE

T2 - 17th International Winterschool/Euroconference on Electronic Properties of Novel Materials

Y2 - 8 March 2003 through 15 March 2003

ER -

Characterization of electromigration-induced gold nanogaps

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Keywords

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