Charge localization in collision-induced multiple ionization of van der Waals clusters with highly charged ions

W. Tappe, R. Flesch, E. Rühl, R.A. Hoekstra, T.A. Schlathölter

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    36 Citations (Scopus)

    Abstract

    Charge localization in multiple ionization and fragmentation of small argon clusters is reported. The processes are initiated by interaction of the neutral cluster with highly charged Xeq+ (5 less than or equal to q less than or equal to 25) Products are detected by means of multicoincidence time-of-flight methods. A strong dependence of the fragmentation pattern on the Xe charge state q is observed. In particular, we find evidence for formation of multiply charged atomic Arr+ fragment ions up to r = 7. Such high charge states have neither been observed in fission of multiply charged van der Waals clusters nor in ion-induced fragmentation of fullerenes or metal clusters. This hints at fundamentally different excitation and fragmentation dynamics.

    Original languageEnglish
    Article number143401
    Number of pages4
    JournalPhysical Review Letters
    Volume88
    Issue number14
    DOIs
    Publication statusPublished - 8-Apr-2002

    Keywords

    • ARGON CLUSTERS
    • ELECTRON-CAPTURE
    • METAL-CLUSTERS
    • FRAGMENTATION
    • C-60
    • SPECTROSCOPY
    • EXCITATION
    • EXPLOSION

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