Abstract
Charge localization in multiple ionization and fragmentation of small argon clusters is reported. The processes are initiated by interaction of the neutral cluster with highly charged Xeq+ (5 less than or equal to q less than or equal to 25) Products are detected by means of multicoincidence time-of-flight methods. A strong dependence of the fragmentation pattern on the Xe charge state q is observed. In particular, we find evidence for formation of multiply charged atomic Arr+ fragment ions up to r = 7. Such high charge states have neither been observed in fission of multiply charged van der Waals clusters nor in ion-induced fragmentation of fullerenes or metal clusters. This hints at fundamentally different excitation and fragmentation dynamics.
Original language | English |
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Article number | 143401 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 88 |
Issue number | 14 |
DOIs | |
Publication status | Published - 8-Apr-2002 |
Keywords
- ARGON CLUSTERS
- ELECTRON-CAPTURE
- METAL-CLUSTERS
- FRAGMENTATION
- C-60
- SPECTROSCOPY
- EXCITATION
- EXPLOSION