Abstract
The key role of the pentacene kinetic energy (E-k) in the early stages of growth on SiOx/Si is demonstrated: islands with smooth borders and increased coalescence differ remarkably from fractal-like thermal growth. Increasing E-k to 6.4 eV, the morphology evolves towards higher density of smaller islands. At higher coverage, coalescence grows with E-k up to a much more uniform, less defected monolayer. The growth, interpreted by the diffusion mediated model, shows the critical nucleus changing from 3 to 2 pentacene for E-k > 5-6 eV. Optimal conditions to produce single crystalline films are envisaged.
Original language | English |
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Article number | 076601 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 98 |
Issue number | 7 |
DOIs | |
Publication status | Published - 16-Feb-2007 |
Keywords
- THIN-FILM TRANSISTORS
- SIZE DISTRIBUTION
- DYNAMICS
- MORPHOLOGY