Count rates and structure factors in anomalous soft x-ray scattering from cuprate superconductors

P Abbamonte*, A Rusydi, G Logvenov, [No Value] Bozovic, GA Sawatzky, L.C. Venema

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

It has recently been shown that x-ray diffraction from the doped holes in cuprates can be enhanced by 3-4 orders of magnitude by exploiting resonance effects in the oxygen K shell. This new type of anomalous scattering is direct way of probing ground state inhomogeneity in the mobile carrier liquid of high temperature superconductors. Here we describe a model which quantifies the relationship between experimental count rates and the structure factor for doped holes in this technique. We describe first efforts to detect inhomogeneity in thin films of La2CuO4+delta and report some peculiar observations. We attempt to offer some explanation.

Original languageEnglish
Title of host publicationSUPERCONDUCTING AND RELATED OXIDES: PHYSICS AND NANOENGINEERING V
Editors Bozovic, D Pavuna
Place of PublicationBELLINGHAM
PublisherSPIE - INT SOC OPTICAL ENGINEERING
Pages60-64
Number of pages5
ISBN (Print)0-8194-4579-7
Publication statusPublished - 2002
EventConference on Superconducting and Related Oxides - Physics and Nanoengineering V -
Duration: 8-Jul-200211-Jul-2002

Publication series

NamePROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Volume4811
ISSN (Print)0277-786X

Other

OtherConference on Superconducting and Related Oxides - Physics and Nanoengineering V
Period08/07/200211/07/2002

Keywords

  • superconductivity
  • thin films
  • anomalous x-ray scattering
  • inhomogeneity
  • stripes

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