Creep Crack Growth: From Discrete to Continuum Damage Modeling

B.N. Nguyen; P.R. Onck; E. van der Giessen

Creep Crack Growth: From Discrete to Continuum Damage Modeling

B.N. Nguyen, P.R. Onck, E. van der Giessen

Micromechanics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Original language	English
Title of host publication	IUTAM Symposium on Creep in Structures
Editors	S. Murakami, N. Ohno
Place of Publication	Nagoya
Publisher	Springer
Pages	65-74
Number of pages	10
Volume	86
Edition	86
ISBN (Electronic)	9789401596282
ISBN (Print)	9789048156238
Publication status	Published - 2001
Event	IUTAM Symposium on Creep in Structures, Nagoya, Japan - Duration: 3-Apr-2000 → 7-Apr-2000

Conference

Conference	IUTAM Symposium on Creep in Structures, Nagoya, Japan
Period	03/04/2000 → 07/04/2000

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Cite this

@inproceedings{7ad06c3c07e4403c8d1160e921868765,

title = "Creep Crack Growth: From Discrete to Continuum Damage Modeling",

author = "B.N. Nguyen and P.R. Onck and {van der Giessen}, E.",

note = "Relation: http://link.springer.com/ Rights: Springer-Verlag; IUTAM Symposium on Creep in Structures, Nagoya, Japan ; Conference date: 03-04-2000 Through 07-04-2000",

year = "2001",

language = "English",

isbn = "9789048156238",

volume = "86",

pages = "65--74",

editor = "S. Murakami and N. Ohno",

booktitle = "IUTAM Symposium on Creep in Structures",

publisher = "Springer",

edition = "86",

}

TY - GEN

T1 - Creep Crack Growth

T2 - IUTAM Symposium on Creep in Structures, Nagoya, Japan

AU - Nguyen, B.N.

AU - Onck, P.R.

AU - van der Giessen, E.

N1 - Relation: http://link.springer.com/ Rights: Springer-Verlag

PY - 2001

Y1 - 2001

M3 - Conference contribution

SN - 9789048156238

VL - 86

SP - 65

EP - 74

BT - IUTAM Symposium on Creep in Structures

A2 - Murakami, S.

A2 - Ohno, N.

PB - Springer

CY - Nagoya

Y2 - 3 April 2000 through 7 April 2000

ER -