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Dependable Neuromorphic Computing-in-Memory Architectures

  • Farhad Merchant*
  • , Ankit Bende
  • , Markus Fritscher
  • , Shahar Kvatinsky
  • , Simranjeet Singh
  • , Vikas Rana
  • , Regina Dittmann
  • , Keerthi Dorai Swamy Reddy
  • , Christian Wenger
  • , Fouwad Jamil Mir
  • , Mottaqiallah Taouil
  • , Manil Dev Gomony
  • , Said Hamdioui
  • , Henk Corporaal
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

Recently, neuromorphic computing has shown tremendous promise due to its energy efficiency and performance. Many academic and industrial initiatives focus on designing and developing neuromorphic platforms, either using classical complementary metal-oxide semiconductors or emerging exotic technologies. In particular, computing-in-memory (CiM) is one of the preferred paradigms for implementing these systems. Despite these efforts, ensuring the dependability of neuromorphic computing remains challenging due to various factors, such as device and technology non-idealities, aging electronics, fault tolerance, robust learning mechanisms, and security. These challenges hinder the adoption of emerging neuromorphic architectures in mainstream computing applications. To address this issue, this paper presents four consolidated works that tackle these challenges with innovative solutions, ranging from hardware-software co-design-based approaches to side-channel analysis and variability-aware device modeling and implementations.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE European Test Symposium, ETS 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages10
ISBN (Electronic)9798331594503
DOIs
Publication statusPublished - 1-Jul-2025
Event2025 IEEE European Test Symposium, ETS 2025 - Tallinn, Estonia
Duration: 26-May-202530-May-2025

Publication series

NameProceedings of the European Test Workshop
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780

Conference

Conference2025 IEEE European Test Symposium, ETS 2025
Country/TerritoryEstonia
CityTallinn
Period26/05/202530/05/2025

Keywords

  • computing-in-memory
  • dependability
  • neuromorphic computing
  • reliability
  • RRAM
  • security

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