Design and performance of a programmable-temperature scanning tunneling microscope

M. S. Hoogeman*, D. Glastra Van Loon, R. W.M. Loos, H. G. Ficke, E. De Haas, J. J. Van Der Linden, H. Zeijlemaker, L. Kuipers, M. F. Chang, M. A.J. Klik, J. W.M. Frenken

*Corresponding author for this work

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