Direct observation of reversible oxygen migration and phase transitions in ferroelectric Hf0.5Zr0.5O2 thin-film devices

Pavan Nukala, Majid Ahmadi^*, Sytze de Graaf, Bart Kooi, Beatriz Noheda, Henny W. Zandbergen, Yingfen Wei

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

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Original language	English
Pages (from-to)	956-959
Number of pages	5
Journal	Microscopy and Microanalysis
Volume	27
Issue number	Suppl.1
DOIs	https://doi.org/10.1017/s1431927621003640
Publication status	Published - Aug-2021

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title = "Direct observation of reversible oxygen migration and phase transitions in ferroelectric Hf0.5Zr0.5O2 thin-film devices",

author = "Pavan Nukala and Majid Ahmadi and {de Graaf}, Sytze and Bart Kooi and Beatriz Noheda and Zandbergen, {Henny W.} and Yingfen Wei",

year = "2021",

month = aug,

doi = "10.1017/s1431927621003640",

language = "English",

volume = "27",

pages = "956--959",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl.1",

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TY - JOUR

T1 - Direct observation of reversible oxygen migration and phase transitions in ferroelectric Hf0.5Zr0.5O2 thin-film devices

AU - Nukala, Pavan

AU - Ahmadi, Majid

AU - de Graaf, Sytze

AU - Kooi, Bart

AU - Noheda, Beatriz

AU - Zandbergen, Henny W.

AU - Wei, Yingfen

PY - 2021/8

Y1 - 2021/8

U2 - 10.1017/s1431927621003640

DO - 10.1017/s1431927621003640

M3 - Article

SN - 1431-9276

VL - 27

SP - 956

EP - 959

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Suppl.1

ER -