DRAM-Specific Space of Memory Tests

Zaid Al-Ars*, Said Hamdioui, Ad Van De Goor, Georgi Gaydadjiev, Joerg Vollrath

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

7 Citations (Scopus)


DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.

Original languageEnglish
Title of host publication2006 IEEE International Test Conference
ISBN (Print)978-1-4244-0291-3
Publication statusPublished - 1-Dec-2007
Externally publishedYes
Event2006 IEEE International Test Conference, ITC - Santa Clara, CA, United States
Duration: 22-Oct-200627-Oct-2006

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539
ISSN (Electronic)2378-2250


Conference2006 IEEE International Test Conference, ITC
Country/TerritoryUnited States
CitySanta Clara, CA

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