DRAM-Specific Space of Memory Tests

Zaid Al-Ars; Said Hamdioui; Ad Van De Goor; Georgi Gaydadjiev; Joerg Vollrath

doi:10.1109/TEST.2006.297701

DRAM-Specific Space of Memory Tests

Zaid Al-Ars^*, Said Hamdioui, Ad Van De Goor, Georgi Gaydadjiev, Joerg Vollrath

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

7 Citations (Scopus)

Abstract

DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.

Original language	English
Title of host publication	2006 IEEE International Test Conference
Publisher	IEEE
ISBN (Print)	978-1-4244-0291-3
DOIs	https://doi.org/10.1109/TEST.2006.297701
Publication status	Published - 1-Dec-2007
Externally published	Yes
Event	2006 IEEE International Test Conference, ITC - Santa Clara, CA, United States Duration: 22-Oct-2006 → 27-Oct-2006

Publication series

Name	Proceedings - International Test Conference
ISSN (Print)	1089-3539
ISSN (Electronic)	2378-2250

Conference

Conference	2006 IEEE International Test Conference, ITC
Country/Territory	United States
City	Santa Clara, CA
Period	22/10/2006 → 27/10/2006

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10.1109/TEST.2006.297701

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title = "DRAM-Specific Space of Memory Tests",

abstract = "DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.",

author = "Zaid Al-Ars and Said Hamdioui and {Van De Goor}, Ad and Georgi Gaydadjiev and Joerg Vollrath",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/TEST.2006.297701",

language = "English",

isbn = "978-1-4244-0291-3",

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T1 - DRAM-Specific Space of Memory Tests

AU - Al-Ars, Zaid

AU - Hamdioui, Said

AU - Van De Goor, Ad

AU - Gaydadjiev, Georgi

AU - Vollrath, Joerg

PY - 2007/12/1

Y1 - 2007/12/1

N2 - DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.

AB - DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice.

UR - http://www.scopus.com/inward/record.url?scp=39749140291&partnerID=8YFLogxK

U2 - 10.1109/TEST.2006.297701

DO - 10.1109/TEST.2006.297701

M3 - Conference contribution

SN - 978-1-4244-0291-3

T3 - Proceedings - International Test Conference

BT - 2006 IEEE International Test Conference

PB - IEEE

T2 - 2006 IEEE International Test Conference, ITC

Y2 - 22 October 2006 through 27 October 2006

ER -

DRAM-Specific Space of Memory Tests

Abstract

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Conference

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