Electronic-transitions and excitations in solid C-70 studied by EELS and XPS c-1s satellite structures

Bo-ying Han, Li-ming Yu, K. Hevesi, G. Gensterblum, P. Rudolf, J.-J. Pireaux, P.A. Thiry, R. Caudano, Ph. Lambin, A.A. Lucas

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The electronic transition and excitation properties of highly ordered C70 films have been studied by reflection electron-energy-loss spectroscopy (EELS) and x-ray photoemission spectroscopy (XPS) C 1s satellite structures. The EELS study revealed a total of 11 features in the energy-loss range 1–40 eV. These include two tight-binding Frenkel excitonic levels in C70 fullerite, at 1.53 and 1.88 eV; the feature at 2.20 eV correlated with the onset of the electron transitions between the highest occupied molecular-orbital- and lowest occupied molecular-orbital-derived bands; a doublet at around 6 eV showing evidence of the π-plasmon splitting of fullerite C70. A broad hump at ~28 eV corresponds to the excitation of the (σ + π) plasmon. The XPS C 1s satellite structures were found to be in overall agreement with the EELS results in the corresponding energy-loss range. By comparing the EELS data with the direct and inverse photoemission data, the on-site Coulomb correlation energy has been determined to be 1.2±0.2 eV for C70 fullerite.
Original languageEnglish
Pages (from-to)7179-7185
Number of pages7
JournalPhysical Review B
Issue number11
Publication statusPublished - 15-Mar-1995




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