Evaluating Model Fit in Two-Level Mokken Scale Analysis

Letty Koopman*, Bonne J. H. Zijlstra, L. Andries Van der Ark

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

Currently, two-level Mokken scale analysis for clustered test data is being developed. This paper contributes to this development by providing model-fit procedures for two-level Mokken scale analysis. New theoretical insights suggested that the existing model-fit procedure from traditional (one-level) Mokken scale analyses can be used for investigating model fit at both level 1 (respondent level) and level 2 (cluster level) of two-level Mokken scale analysis. However, the traditional model-fit procedure requires some modifications before it can be used at level 2. In this paper, we made these modifications and investigated the resulting model-fit procedure. For two model assumptions, monotonicity and invariant item ordering, we investigated the false-positive count and the sensitivity count of the level 2 model-fit procedure, with respect to the number of model violations detected, and the number of detected model violations deemed statistically significant. For monotonicity, the detection of model violations was satisfactory, but the significance test lacked power. For invariant item ordering, both aspects were satisfactory.
Original languageEnglish
Pages (from-to)847-865
Number of pages19
JournalPsych
Volume5
Issue number3
DOIs
Publication statusPublished - 7-Aug-2023
Externally publishedYes

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