Evidence for vacancies in amorphous silicon: Reply

GN van den Hoven*, ZN Liang, L Niesen, JS Custer

*Corresponding author for this work

    Research output: Contribution to journalComment/Letter to the editorAcademicpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)2197-2197
    Number of pages1
    JournalPhysical Review Letters
    Volume70
    Issue number14
    Publication statusPublished - 5-Apr-1993

    Keywords

    • DEFECT

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