Extending the voltage window in the characterization of electrical transport of large-area molecular junctions

  • Ilias Katsouras*
  • , Auke J. Kronemeijer
  • , Edsger C. P. Smits
  • , Paul A. van Hal
  • , Tom C. T. Geuns
  • , Paul W. M. Blom
  • , Dago M. de Leeuw
  • *Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)
366 Downloads (Pure)

Abstract

A large bias window is required to discriminate between different transport models in large-area molecular junctions. Under continuous DC bias, the junctions irreversibly break down at fields over 9 MV/cm. We show that, by using pulse measurements, we can reach electrical fields of 35 MV/cm before degradation. The breakdown voltage is shown to depend logarithmically on both duty cycle and pulse width. A tentative interpretation is presented based on electrolysis in the polymeric top electrode. Expanding the bias window using pulse measurements unambiguously shows that the electrical transport exhibits not an exponential but a power-law dependence on bias. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3608154]

Original languageEnglish
Article number013303
Pages (from-to)013303-1-013303-3
Number of pages3
JournalApplied Physics Letters
Volume99
Issue number1
DOIs
Publication statusPublished - 4-Jul-2011

Keywords

  • SELF-ASSEMBLED MONOLAYERS
  • THIN INSULATING FILM
  • METAL JUNCTIONS
  • BREAKDOWN

Fingerprint

Dive into the research topics of 'Extending the voltage window in the characterization of electrical transport of large-area molecular junctions'. Together they form a unique fingerprint.

Cite this