Abstract
A large bias window is required to discriminate between different transport models in large-area molecular junctions. Under continuous DC bias, the junctions irreversibly break down at fields over 9 MV/cm. We show that, by using pulse measurements, we can reach electrical fields of 35 MV/cm before degradation. The breakdown voltage is shown to depend logarithmically on both duty cycle and pulse width. A tentative interpretation is presented based on electrolysis in the polymeric top electrode. Expanding the bias window using pulse measurements unambiguously shows that the electrical transport exhibits not an exponential but a power-law dependence on bias. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3608154]
| Original language | English |
|---|---|
| Article number | 013303 |
| Pages (from-to) | 013303-1-013303-3 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 99 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 4-Jul-2011 |
Keywords
- SELF-ASSEMBLED MONOLAYERS
- THIN INSULATING FILM
- METAL JUNCTIONS
- BREAKDOWN
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