High Energy Resolution Fluorescence Detection X‐Ray Absorption Spectroscopy: Detection of Adsorption Sites in Supported Metal Catalysts

Moniek Tromp*, Jeroen A. Van Bokhoven, Olga V. Safonova, Frank M.F. De Groot, John Evans, Pieter Glatzel

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)

Abstract

High energy resolution fluorescence detection (HERFD) X-ray adsorption spectroscopy (XAS) is demonstrated as a new tool to identify the geometry of metal adsorption sites and the orbitals involved in bonding. The type of CO adsorption site on a nanoparticular Pt-Al2O3 catalyst is determined. The orbitals involved in the Pt - CO bonding are identified using theoretical FEFF8.0 calculations. In situ application of HERFD XAS is applicable to a large number of catalytic systems and will provide fundamental insights in structure - performance relationships.

Original languageEnglish
Title of host publicationX-RAY ABSORPTION FINE STRUCTURE - XAFS13
Subtitle of host publication13th International Conference
PublisherAIP PRESS
Pages651-653
Number of pages3
ISBN (Print)9780735403840
DOIs
Publication statusPublished - 26-Mar-2007
Externally publishedYes
EventX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference - Stanford, CA, United States
Duration: 9-Jul-200614-Jul-2006

Publication series

NameAIP Conference Proceedings
Volume882
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference
CountryUnited States
CityStanford, CA
Period09/07/200614/07/2006

Keywords

  • CO adsorption
  • HERFD XAS
  • High energy resolution
  • In situ
  • XANES

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