Influence of hydrogen on the stability of positively charged silicon dioxide clusters

T. Schenkel; T. Schlatholter; M. W. Newman; G. A. Machicoane; J. W. McDonald; A. V. Hamza

doi:10.1063/1.482058

Influence of hydrogen on the stability of positively charged silicon dioxide clusters

T. Schenkel, T. Schlatholter, M. W. Newman, G. A. Machicoane, J. W. McDonald, A. V. Hamza

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Abstract

Spectra of positively charged secondary ions from thermally grown SiO(2) films were recorded in a time-of-flight secondary ion mass spectrometry scheme. Ablation of cluster ions was induced by the impact of slow (4 keV/u) Au(69+) projectiles. The intensities of Si(x)O(y)H(z)(+), (x=1-22, y=1-44, z=0-7) clusters are found to depend sensitively on the oxygen to silicon ratio and also on the hydrogen content. We find that oxygen rich clusters, y=2x+1, and, in one case, y=2x+2, can be stabilized by the incorporation of two additional hydrogen atoms in the cluster. (C) 2000 American Institute of Physics. [S0021-9606(00)70630-1].

Original language	English
Article number	PII [S0021-9606(00)70630-1]
Pages (from-to)	2419-2422
Number of pages	4
Journal	Journal of Chemical Physics
Volume	113
Issue number	6
DOIs	https://doi.org/10.1063/1.482058
Publication status	Published - 8-Aug-2000

Keywords

MASS-SPECTROMETRY
ION EMISSION
SLOW
SURFACES
TIME
SIO2

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title = "Influence of hydrogen on the stability of positively charged silicon dioxide clusters",

abstract = "Spectra of positively charged secondary ions from thermally grown SiO(2) films were recorded in a time-of-flight secondary ion mass spectrometry scheme. Ablation of cluster ions was induced by the impact of slow (4 keV/u) Au(69+) projectiles. The intensities of Si(x)O(y)H(z)(+), (x=1-22, y=1-44, z=0-7) clusters are found to depend sensitively on the oxygen to silicon ratio and also on the hydrogen content. We find that oxygen rich clusters, y=2x+1, and, in one case, y=2x+2, can be stabilized by the incorporation of two additional hydrogen atoms in the cluster. (C) 2000 American Institute of Physics. [S0021-9606(00)70630-1].",

keywords = "MASS-SPECTROMETRY, ION EMISSION, SLOW, SURFACES, TIME, SIO2",

author = "T. Schenkel and T. Schlatholter and Newman, {M. W.} and Machicoane, {G. A.} and McDonald, {J. W.} and Hamza, {A. V.}",

year = "2000",

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doi = "10.1063/1.482058",

language = "English",

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T1 - Influence of hydrogen on the stability of positively charged silicon dioxide clusters

AU - Schenkel, T.

AU - Schlatholter, T.

AU - Newman, M. W.

AU - Machicoane, G. A.

AU - McDonald, J. W.

AU - Hamza, A. V.

PY - 2000/8/8

Y1 - 2000/8/8

N2 - Spectra of positively charged secondary ions from thermally grown SiO(2) films were recorded in a time-of-flight secondary ion mass spectrometry scheme. Ablation of cluster ions was induced by the impact of slow (4 keV/u) Au(69+) projectiles. The intensities of Si(x)O(y)H(z)(+), (x=1-22, y=1-44, z=0-7) clusters are found to depend sensitively on the oxygen to silicon ratio and also on the hydrogen content. We find that oxygen rich clusters, y=2x+1, and, in one case, y=2x+2, can be stabilized by the incorporation of two additional hydrogen atoms in the cluster. (C) 2000 American Institute of Physics. [S0021-9606(00)70630-1].

AB - Spectra of positively charged secondary ions from thermally grown SiO(2) films were recorded in a time-of-flight secondary ion mass spectrometry scheme. Ablation of cluster ions was induced by the impact of slow (4 keV/u) Au(69+) projectiles. The intensities of Si(x)O(y)H(z)(+), (x=1-22, y=1-44, z=0-7) clusters are found to depend sensitively on the oxygen to silicon ratio and also on the hydrogen content. We find that oxygen rich clusters, y=2x+1, and, in one case, y=2x+2, can be stabilized by the incorporation of two additional hydrogen atoms in the cluster. (C) 2000 American Institute of Physics. [S0021-9606(00)70630-1].

KW - MASS-SPECTROMETRY

KW - ION EMISSION

KW - SLOW

KW - SURFACES

KW - TIME

KW - SIO2

U2 - 10.1063/1.482058

DO - 10.1063/1.482058

M3 - Article

SN - 0021-9606

VL - 113

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EP - 2422

JO - Journal of Chemical Physics

JF - Journal of Chemical Physics

IS - 6

M1 - PII [S0021-9606(00)70630-1]

ER -

Influence of hydrogen on the stability of positively charged silicon dioxide clusters

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Keywords

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