Influence of random roughness on the Casimir force at small separations

P. J. van Zwol, G. Palasantzas*, J. Th. M. De Hosson

*Corresponding author for this work

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Abstract

The influence of random surface roughness of Au films on the Casimir force is explored with atomic force microscopy in the plate-sphere geometry. The experimental results are compared to theoretical predictions for separations ranging between 20 and 200 nm. The optical response and roughness of the Au films were measured and used as input in theoretical predictions. It is found that at separations below 100 nm, the roughness effect is manifested through a strong deviation from the normal scaling of the force with separation distance. Moreover, deviations from theoretical predictions based on perturbation theory can be larger than 100%.

Original languageEnglish
Article number075412
Number of pages5
JournalPhysical Review. B: Condensed Matter and Materials Physics
Volume77
Issue number7
DOIs
Publication statusPublished - Feb-2008

Keywords

  • MICROELECTROMECHANICAL SYSTEMS
  • SURFACES

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