Abstract
We show that from measurements of reflectivity of a uniaxial medium taken at a finite incidence angle with s- and p-polarized light it is possible to determine the dielectric function both parallel and perpendicular to the optical axis. When applied to a layered compound with its surface parallel to the layers, this technique allows for an accurate determination of the loss function perpendicular to the layers. This is demonstrated for the case of c-axis-oriented films of the high-temperature superconductor Tl2Ba2Ca2Cu3O10, on which we carried out polarized reflectivity measurements at 45 degrees incidence angle above and below T-c. We also studied the infrared response of La1.85Sr0.15CuO4 single crystals with the light polarized parallel and perpendicular to the c axis as a function of temperature. We confirm the results reported by Tamasaku et al. [Phys. Rev. Lett. 69 (1999) 1455]: in the superconducting state a plasma branch occurs below the gap.
| Original language | English |
|---|---|
| Pages (from-to) | 1577 - 1578 |
| Number of pages | 2 |
| Journal | Synthetic Metals |
| Volume | 71 |
| Issue number | 1-3 |
| Publication status | Published - 1-Apr-1995 |
| Event | International Conference on Science and Technology of Synthetic Metals (ICSM 94) - Duration: 24-Jul-1994 → 29-Jul-1994 |