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Measurements of Xe-110 and Te-106 decay half-lives

  • Z Janas*
  • , C Mazzocchi
  • , L Batist
  • , A Blazhev
  • , M Gorska
  • , M Kavatsyuk
  • , O Kavatsyuk
  • , R Kirchner
  • , A Korgul
  • , M La Commara
  • , K Miernik
  • , I. Mukha
  • , A Plochocki
  • , E Roeckl
  • , K Schmidt
  • *Corresponding author for this work

    Research output: Contribution to journalArticleAcademicpeer-review

    38 Citations (Scopus)

    Abstract

    The alpha-decays of Xe-110 and Te-106 were studied at the GSI on-line mass separator. By using the grow-in and decay of the alpha activity, observed in pulsed-beam measurement, the half-life of Xe-110 was found to be T-1/2 = 105(-25)(+35) ms. The lifetime of Te-106 was determined to be T-1/2 = 70(-10)(+20) mus by measuring the time between two successive Xe-110 --> Te-106 --> Sn-102 alpha-decays. The newly determined half-lives were used to calculate reduced alpha-decay widths for Te-106 and Xe-110. Universal systematics of reduced alpha widths are proposed to search for the evidence of enhancement of the a formation amplitude in the emitters above Sn-100.

    Original languageEnglish
    Pages (from-to)197-200
    Number of pages4
    JournalEuropean Physical Journal A
    Volume23
    Issue number2
    DOIs
    Publication statusPublished - Feb-2005

    Keywords

    • ALPHA-DECAY

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