Morphology identification of the thin film phases of vacuum evaporated pentacene on SIO2 substrates

I.P.M. Bouchoms, W.A Schoonveld, J Vrijmoeth, T.M Klapwijk

Research output: Contribution to journalArticleAcademicpeer-review

268 Citations (Scopus)
Original languageDutch
Pages (from-to)175 - 178
Number of pages4
JournalSynthetic Metals
Volume104
Issue number3
Publication statusPublished - 1999

Keywords

  • evaporation
  • sublimation
  • atomic force microscopy
  • X-ray diffraction
  • polycrystalline thin films

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