Note: Spring constant calibration of nanosurface-engineered atomic force microscopy cantilevers

O. Ergincan*, G. Palasantzas, B. J. Kooi

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)
286 Downloads (Pure)

Abstract

The determination of the dynamic spring constant (kd) of atomic force microscopy cantilevers is of crucial importance for converting cantilever deflection to accurate force data. Indeed, the nondestructive, fast, and accurate measurement method of the cantilever dynamic spring constant is confirmed here for plane geometry but surface modified cantilevers. It is found that the measured spring constants (keff, the dynamic one kd), and the calculated (kd,1) are in good agreement within less than 10% error.
Original languageEnglish
Article number026118
Pages (from-to)026118-1-026118-3
Number of pages3
JournalReview of Scientific Instruments
Volume85
Issue number2
DOIs
Publication statusPublished - Feb-2014

Keywords

  • SENSORS

Cite this