Optimization of a charge-state analyzer for electron cyclotron resonance ion source beams

S. Saminathan, J. P. M. Beijers*, H. R. Kremers, V. Mironov, J. Mulder, S. Brandenburg

*Corresponding author for this work

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Abstract

A detailed experimental and simulation study of the extraction of a 24 keV He+ beam from an ECR ion source and the subsequent beam transport through an analyzing magnet is presented. We find that such a slow ion beam is very sensitive to space-charge forces, but also that the neutralization of the beam's space charge by secondary electrons is virtually complete for beam currents up to at least 0.5 mA. The beam emittance directly behind the extraction system is 65 pi mm mrad and is determined by the fact that the ion beam is extracted in the strong magnetic fringe field of the ion source. The relatively large emittance of the beam and its non-paraxiality lead, in combination with a relatively small magnet gap, to significant beam losses and a five-fold increase of the effective beam emittance during its transport through the analyzing magnet. The calculated beam profile and phase-space distributions in the image plane of the analyzing magnet agree well with measurements. The kinematic and magnet aberrations have been studied using the calculated second-order transfer map of the analyzing magnet, with which we can reproduce the phase-space distributions of the ion beam behind the analyzing magnet. Using the transfer map and trajectory calculations we have worked out an aberration compensation scheme based on the addition of compensating hexapole components to the main dipole field by modifying the shape of the poles. The simulations predict that by compensating the kinematic and geometric aberrations in this way and enlarging the pole gap the overall beam transport efficiency can be increased from 16% to 45%. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4733297]

Original languageEnglish
Article number073305
Number of pages6
JournalReview of Scientific Instruments
Volume83
Issue number7
DOIs
Publication statusPublished - Jul-2012

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