Piezoelectric properties of PbTiO(3) thin films characterized with piezoresponse force and high resolution transmission electron microscopy

A. Morelli; Sriram Venkatesan; B. J. Kooi; G. Palasantzas; J. Th. M. De Hosson

doi:10.1063/1.3088913

Piezoelectric properties of PbTiO(3) thin films characterized with piezoresponse force and high resolution transmission electron microscopy

A. Morelli, Sriram Venkatesan, B. J. Kooi, G. Palasantzas^*, J. Th. M. De Hosson

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

In this paper we investigate the piezoelectric properties of PbTiO(3) thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

Original language	English
Article number	064106
Pages (from-to)	064106-1-064106-6
Number of pages	6
Journal	Journal of Applied Physics
Volume	105
Issue number	6
DOIs	https://doi.org/10.1063/1.3088913
Publication status	Published - 15-Mar-2009

Keywords

dielectric polarisation
electric domains
ferroelectric coercive field
ferroelectric thin films
lead compounds
pulsed laser deposition
strontium compounds
transmission electron microscopy
NANOSCALE
DEPENDENCE
RETENTION
CERAMICS
DYNAMICS

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10.1063/1.3088913

Piezoelectric properties of PbTiO3 thin films characterizedFinal publisher's version, 675 KBLicence: Unspecified

Cite this

@article{cfac8904010a49c9a00f233572b90021,

title = "Piezoelectric properties of PbTiO(3) thin films characterized with piezoresponse force and high resolution transmission electron microscopy",

abstract = "In this paper we investigate the piezoelectric properties of PbTiO(3) thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.",

keywords = "dielectric polarisation, electric domains, ferroelectric coercive field, ferroelectric thin films, lead compounds, pulsed laser deposition, strontium compounds, transmission electron microscopy, NANOSCALE, DEPENDENCE, RETENTION, CERAMICS, DYNAMICS",

author = "A. Morelli and Sriram Venkatesan and Kooi, {B. J.} and G. Palasantzas and {De Hosson}, {J. Th. M.}",

year = "2009",

month = mar,

day = "15",

doi = "10.1063/1.3088913",

language = "English",

volume = "105",

pages = "064106--1--064106--6",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "AMER INST PHYSICS",

number = "6",

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Piezoelectric properties of PbTiO(3) thin films characterized with piezoresponse force and high resolution transmission electron microscopy. / Morelli, A.; Venkatesan, Sriram; Kooi, B. J.; Palasantzas, G.; De Hosson, J. Th. M.

In: Journal of Applied Physics, Vol. 105, No. 6, 064106, 15.03.2009, p. 064106-1-064106-6.

Research output: Contribution to journal › Article › Academic › peer-review

TY - JOUR

T1 - Piezoelectric properties of PbTiO(3) thin films characterized with piezoresponse force and high resolution transmission electron microscopy

AU - Morelli, A.

AU - Venkatesan, Sriram

AU - Kooi, B. J.

AU - Palasantzas, G.

AU - De Hosson, J. Th. M.

PY - 2009/3/15

Y1 - 2009/3/15

N2 - In this paper we investigate the piezoelectric properties of PbTiO(3) thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

AB - In this paper we investigate the piezoelectric properties of PbTiO(3) thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

KW - dielectric polarisation

KW - electric domains

KW - ferroelectric coercive field

KW - ferroelectric thin films

KW - lead compounds

KW - pulsed laser deposition

KW - strontium compounds

KW - transmission electron microscopy

KW - NANOSCALE

KW - DEPENDENCE

KW - RETENTION

KW - CERAMICS

KW - DYNAMICS

U2 - 10.1063/1.3088913

DO - 10.1063/1.3088913

M3 - Article

VL - 105

SP - 064106-1-064106-6

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 6

M1 - 064106

ER -