Piezoelectric properties of PbTiO(3) thin films characterized with piezoresponse force and high resolution transmission electron microscopy

A. Morelli, Sriram Venkatesan, B. J. Kooi, G. Palasantzas*, J. Th. M. De Hosson

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

In this paper we investigate the piezoelectric properties of PbTiO(3) thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.
Original languageEnglish
Article number064106
Pages (from-to)064106-1-064106-6
Number of pages6
JournalJournal of Applied Physics
Volume105
Issue number6
DOIs
Publication statusPublished - 15-Mar-2009

Keywords

  • dielectric polarisation
  • electric domains
  • ferroelectric coercive field
  • ferroelectric thin films
  • lead compounds
  • pulsed laser deposition
  • strontium compounds
  • transmission electron microscopy
  • NANOSCALE
  • DEPENDENCE
  • RETENTION
  • CERAMICS
  • DYNAMICS

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