Abstract
In this paper we investigate the piezoelectric properties of PbTiO(3) thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.
Original language | English |
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Article number | 064106 |
Pages (from-to) | 064106-1-064106-6 |
Number of pages | 6 |
Journal | Journal of Applied Physics |
Volume | 105 |
Issue number | 6 |
DOIs | |
Publication status | Published - 15-Mar-2009 |
Keywords
- dielectric polarisation
- electric domains
- ferroelectric coercive field
- ferroelectric thin films
- lead compounds
- pulsed laser deposition
- strontium compounds
- transmission electron microscopy
- NANOSCALE
- DEPENDENCE
- RETENTION
- CERAMICS
- DYNAMICS