TY - GEN
T1 - Piezoresponse force microscopy characterization of PTO thin films
AU - Morelli, Alessio
AU - Venkatesan, Sriram
AU - Palasantzas, George
AU - Kooi, Bart J.
AU - De Hosson, Jeff Th M.
PY - 2009/12/1
Y1 - 2009/12/1
N2 - The piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.
AB - The piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.
UR - http://www.scopus.com/inward/record.url?scp=77950557661&partnerID=8YFLogxK
U2 - 10.1557/proc-1186-jj04-03
DO - 10.1557/proc-1186-jj04-03
M3 - Conference contribution
AN - SCOPUS:77950557661
SN - 9781615677894
T3 - Materials Research Society Symposium Proceedings
SP - 19
EP - 24
BT - Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems
PB - Materials Research Society
T2 - 2009 MRS Spring Meeting
Y2 - 14 April 2009 through 16 April 2009
ER -