Piezoresponse force microscopy characterization of PTO thin films

Alessio Morelli*, Sriram Venkatesan, George Palasantzas, Bart J. Kooi, Jeff Th M. De Hosson

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

The piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

Original languageEnglish
Title of host publicationNanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems
PublisherMaterials Research Society
Pages19-24
Number of pages6
ISBN (Print)9781615677894
DOIs
Publication statusPublished - 1-Dec-2009
Event2009 MRS Spring Meeting - San Francisco, CA, United States
Duration: 14-Apr-200916-Apr-2009

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1186
ISSN (Print)0272-9172

Conference

Conference2009 MRS Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA
Period14/04/200916/04/2009

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