Piezoresponse force microscopy characterization of PTO thin films

Alessio Morelli*, Sriram Venkatesan, George Palasantzas, Bart J. Kooi, Jeff Th M. De Hosson

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Keyphrases

Material Science

Engineering