Polarized X-ray fluorescence as a probe of ground state properties

M.A. van Veenendaal, J.B. Goedkoop, B.T Thole

Research output: Contribution to journal › Article › Academic › peer-review

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Handle.net

@article{0b07a6790a5544b9b8aa00ffb6eb8fe5,

title = "Polarized X-ray fluorescence as a probe of ground state properties",

author = "\{van Veenendaal\}, M.A. and J.B. Goedkoop and B.T Thole",

note = "Journal AUG 19 VC336 PHYS REV LETT",

year = "1996",

language = "Dutch",

volume = "77",

pages = "1508 -- 1511",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "AMER PHYSICAL SOC",

number = "8",

}