Positron analysis of defects in metals

A. van Veen, A.C. Kruseman, H. Schut, P.E. Mijnarends, B.J. Kooi, J.T.M. de Hosson

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)

Abstract

New methods are discussed to improve defect analysis. The first method employs mapping of two shape parameters, S and W, of the positron annihilation photopeak. It is demonstrated that the combined use of S and W allows to a better discrimination of defects. The other method is based on background suppression and resolution improvement by the use of two detectors in coincidence. This opens possibilities for characterizing defects by element specific contributions to the momentum distribution of the annihilating e(+)e(-) pair, Examples are given of vacancies in Al-nitride precipitates in iron and manganese oxide precipitates in silver.

Original languageEnglish
Title of host publicationPOSITRON ANNIHILATION
EditorsYC Jean, M Eldrup, DM Schrader, RN West
Place of PublicationZURICH-UETIKON
PublisherTRANS TECH PUBLICATIONS LTD
Pages76-80
Number of pages5
Volume255-2
ISBN (Print)0-87849-779-X
Publication statusPublished - 1997
Event11th International Conference on Positron Annihilation (ICPA-11) -
Duration: 25-May-199730-May-1997

Publication series

NameMATERIALS SCIENCE FORUM
PublisherTRANSTEC PUBLICATIONS LTD
Volume255-2
ISSN (Print)0255-5476

Other

Other11th International Conference on Positron Annihilation (ICPA-11)
Period25/05/199730/05/1997

Keywords

  • positron annihilation
  • defects
  • precipitates
  • two-germanium detector setup
  • positron momentum distribution
  • ANNIHILATION
  • ALUMINUM
  • MODEL

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