Probing momentum distributions in magnetic tunnel junctions via hot-electron decay

R. Jansen, T. Banerjee, B. G. Park, J. C. Lodder

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Abstract

The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of the hot electrons in the Co metal anode after tunneling, using a three-terminal transistor structure in which the hot-electron attenuation is sensitive to the tunnel momentum distribution. Solid state amorphous Al2O3 barriers and the vacuum barrier of a scanning tunneling microscope are compared. For the former the attenuation length in nominally the same Co is strikingly larger (factor of 2), implying a more isotropic tunnel momentum distribution for Al2O3 barriers.
Original languageEnglish
Pages (from-to)192503-1-192503-3
Number of pages3
JournalApplied Physics Letters
Volume90
Issue number19
DOIs
Publication statusPublished - 7-May-2007

Keywords

  • magnetoelectronics
  • tunnel transistors
  • hot electron transistors
  • scanning tunnelling microscopy
  • magnetic tunnelling
  • ferromagnetic materials
  • cobalt
  • ROOM-TEMPERATURE
  • LARGE MAGNETORESISTANCE
  • SPIN
  • TRANSPORT
  • TRANSISTOR
  • MICROSCOPY
  • DEPENDENCE
  • INJECTION

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