Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films

DH Alsem*, EA Stach, JTM De Hosson

*Corresponding author for this work

Research output: Contribution to journalLetterAcademicpeer-review

3 Citations (Scopus)
261 Downloads (Pure)
Original languageEnglish
Pages (from-to)5033-5036
Number of pages4
JournalJournal of Materials Science
Volume40
Issue number18
DOIs
Publication statusPublished - Sep-2005

Keywords

  • SINGLE-CRYSTAL SI
  • VAPOR-DEPOSITION
  • METAL-FILMS

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