Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films

DH Alsem; EA Stach; JTM De Hosson

doi:10.1007/s10853-005-1077-x

Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films

DH Alsem^*, EA Stach, JTM De Hosson

^*Corresponding author for this work

Zernike Institute for Advanced Materials

Research output: Contribution to journal › Letter › Academic › peer-review

3 Citations (Scopus)

261 Downloads (Pure)

Original language	English
Pages (from-to)	5033-5036
Number of pages	4
Journal	Journal of Materials Science
Volume	40
Issue number	18
DOIs	https://doi.org/10.1007/s10853-005-1077-x
Publication status	Published - Sep-2005

Keywords

SINGLE-CRYSTAL SI
VAPOR-DEPOSITION
METAL-FILMS

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@article{c337f862259c4550834151701e8c9ca8,

title = "Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films",

keywords = "SINGLE-CRYSTAL SI, VAPOR-DEPOSITION, METAL-FILMS",

author = "DH Alsem and EA Stach and {De Hosson}, JTM",

year = "2005",

month = sep,

doi = "10.1007/s10853-005-1077-x",

language = "English",

volume = "40",

pages = "5033--5036",

journal = "Journal of Materials Science",

issn = "0022-2461",

publisher = "SPRINGER",

number = "18",

}

TY - JOUR

T1 - Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films

AU - Alsem, DH

AU - Stach, EA

AU - De Hosson, JTM

PY - 2005/9

Y1 - 2005/9

KW - SINGLE-CRYSTAL SI

KW - VAPOR-DEPOSITION

KW - METAL-FILMS

U2 - 10.1007/s10853-005-1077-x

DO - 10.1007/s10853-005-1077-x

M3 - Letter

VL - 40

SP - 5033

EP - 5036

JO - Journal of Materials Science

JF - Journal of Materials Science

SN - 0022-2461

IS - 18

ER -