Abstract
We leverage the attractive properties of a high χ-low N BCP, i.e., poly(styrene)-block-poly(2-fluoroethylmethyl acrylate) (PS-b-P2FEMA), and illustrate its utility for next-generation nanomanufacturing. The synthesis, physical characterization, and thin film self-assembly of a series of lamellar and cylindrical PS-b-P2FEMA BCPs are delineated. PS-b-P2FEMA BCPs with total molecular weights ranging from 7 to 22 kg mol-1 were synthesized by using reversible addition-fragmentation chain-transfer (RAFT) polymerization. Temperature-resolved small-angle X-ray scattering (SAXS) measurements revealed a large χ value (0.13 at 150 °C) for PS-b-P2FEMA. Solvothermal vapor annealing of PS-b-P2FEMA films produced highly oriented fingerprint patterns in as short as 60 s. Lamellar period sizes ranged from 25.9 down to 14.2 nm with feature sizes as small as 7 nm observed. We also demonstrate the integration feasibility of PS-b-P2FEMA BCPs through alumina hardmask formation using sequential infiltration synthesis. The highly favorable characteristics of the P2FEMA-based BCPs detailed here provide a versatile material option to the current library of available BCPs for sub-10 nm nanolithography.
| Original language | English |
|---|---|
| Pages (from-to) | 6246-6254 |
| Number of pages | 9 |
| Journal | Macromolecules |
| Volume | 53 |
| Issue number | 15 |
| DOIs | |
| Publication status | Published - 11-Aug-2020 |
Keywords
- SUB-10 NM FEATURES
- PATTERN TRANSFER
- THIN-FILMS
- METHACRYLATE)
- ORIENTATION
- STRATEGIES
- POLYMERS
- NANOFINS
- DOMAINS