Abstract
It is shown that a weak phase object imaged by an electron microscope within the presence of instabilities of the lense currents and the acceleration voltage, fluctuating electromagnetic field, can be reconstructed from the intensity distribution in the image plane. Perfectly incoherent illumination of the object is assumed and the influence of the energy spread of the illuminating wave on the point spread function of the microscope is rigorously taken into account.
Original language | English |
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Pages (from-to) | 335-350 |
Number of pages | 16 |
Journal | Optik |
Volume | 42 |
Issue number | 4 |
Publication status | Published - 1975 |
Externally published | Yes |