Abstract
NiO thin films have been prepared under UHV conditions by metal evaporation on both ex-situ and in-situ cleaved MgO(100) using O-2 and NO2 as oxidants. Changes in the film morphology are monitored with reflection high-energy electron diffraction (RHEED). While it is possible to grow films epitaxially using O-2, we find films grown using NO2 to be of superior quality, Using NO2 as an oxidant, films synthesized between 200 and 450 degrees C grow layer by layer, while an increase in surface disorder is observed in films grown below 200 degrees C. Pronounced RHEED intensity oscillations are observed for 200
| Original language | English |
|---|---|
| Pages (from-to) | 11-18 |
| Number of pages | 8 |
| Journal | Surface Science |
| Volume | 301 |
| Issue number | 1-3 |
| Publication status | Published - 10-Jan-1994 |
Keywords
- SUPERLATTICES
- OSCILLATIONS