Roughness of microspheres for force measurements

P. J. van Zwol, G. Palasantzas*, M. van de Schootbrugge, J. Th. M. de Hosson, V. S. J. Craig

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

We have investigated the morphology and surface roughness of several commercially available microspheres to determine their suitability for force measurements using the atomic force microscope. The roughness varies considerably, depending on sphere size and material, ranging from nearly ideally flat up to micrometer-sized features. Because surface roughness significantly influences the magnitude and accuracy of measurement of surface forces, the results presented here should be helpful for colloid physicists and in particular for those performing force measurements.

Original languageEnglish
Pages (from-to)7528-7531
Number of pages4
JournalLangmuir
Volume24
Issue number14
DOIs
Publication statusPublished - 15-Jul-2008

Keywords

  • MICROSCOPE
  • VANDERWAALS

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