Scanning Tunneling Microscopy Study of the Thick Film Limit of Kinetic Roughening

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Abstract

The spatial and temporal scaling behaviors of vapor-deposited silver films have been investigated by means of scanning tunneling microscopy for the film thickness range ≈10–1000 nm. The roughness, growth, and dynamic scaling exponents have been independently measured (α = 0.82 ± 0.05, β = 0.29 ± 0.06, and z = 2.5 ± 0.5), and they exhibit no evolution with film thickness.
Original languageEnglish
Number of pages5
JournalPhysical Review Letters
Volume73
Issue number26
DOIs
Publication statusPublished - 1994

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