Secondary electron emission as a technique for in situ crystal alignment in low ion-energy reflection experiments

Research output: Contribution to journal › Comment/Letter to the editor › Academic › peer-review

9 Citations (Scopus)

Original language	English
Pages (from-to)	1174-1175
Number of pages	2
Journal	Journal of physics e-Scientific instruments
Volume	6
Issue number	12
Publication status	Published - 1973

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Secondary electron emission as a technique for insitu crystal alignment in low ion-energy reflectionexperiments
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@article{61b6c69acb864c899b6a9cae7e33e2a5,

title = "Secondary electron emission as a technique for in situ crystal alignment in low ion-energy reflection experiments",

author = "HHW Feijen and LK Verhey and AL Boers and Suurmeijer, \{E P Th M\}",

year = "1973",

language = "English",

volume = "6",

pages = "1174--1175",

journal = "Journal of physics e-Scientific instruments",

issn = "0022-3735",

publisher = "IoP Publishing",

number = "12",

}

TY - JOUR

T1 - Secondary electron emission as a technique for in situ crystal alignment in low ion-energy reflection experiments

AU - Feijen, HHW

AU - Verhey, LK

AU - Boers, AL

AU - Suurmeijer, E P Th M

PY - 1973

Y1 - 1973

M3 - Comment/Letter to the editor

SN - 0022-3735

VL - 6

SP - 1174

EP - 1175

JO - Journal of physics e-Scientific instruments

JF - Journal of physics e-Scientific instruments

IS - 12

ER -