SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Andrea Coronetti; Matteo Cecchetto; Jialei Wang; Maris Tali; Pablo Fernandez Martinez; Maria Kastriotou; Athina Papadopoulou; Kacper Bilko; Florent Castellani; Mario Sacristan; Ruben Garcia Alia; Carlo Cazzaniga; Yolanda Morilla; Pedro Martin-Holgado; Marc Jan Van Goethem; Harry Kiewiet; Emiel van der Graaf; Sytze Brandenburg; Wojtek Hajdas; Laura Sinkunaite; Miroslaw Marszalek; Heikki Kettunen; Mikko Rossi; Jukka Jaatinen; Arto Javanainen; Marie Helene Moscatello; Salvatore Fiore; Giulia Bazzano; Christopher Frost; Manon Letiche; Wilfrid Farabolini; Antonio Gilardi; Roberto Corsini; Helmut Puchner

doi:10.1109/REDW51883.2020.9325822

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Andrea Coronetti^*, Matteo Cecchetto, Jialei Wang, Maris Tali, Pablo Fernandez Martinez, Maria Kastriotou, Athina Papadopoulou, Kacper Bilko, Florent Castellani, Mario Sacristan, Ruben Garcia Alia, Carlo Cazzaniga, Yolanda Morilla, Pedro Martin-Holgado, Marc Jan Van Goethem, Harry Kiewiet, Emiel van der Graaf, Sytze Brandenburg, Wojtek Hajdas, Laura SinkunaiteMiroslaw Marszalek, Heikki Kettunen, Mikko Rossi, Jukka Jaatinen, Arto Javanainen, Marie Helene Moscatello, Salvatore Fiore, Giulia Bazzano, Christopher Frost, Manon Letiche, Wilfrid Farabolini, Antonio Gilardi, Roberto Corsini, Helmut Puchner

^*Corresponding author for this work

Damage and Repair in Cancer Development and Cancer Treatment (DARE)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

Abstract

The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low-and high-energy protons, heavy ions, thermal, intermediate-and high-energy neutrons, high-energy electrons and high-energy pions.

Original language	English
Title of host publication	2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Number of pages	8
ISBN (Electronic)	9780738110851
DOIs	https://doi.org/10.1109/REDW51883.2020.9325822
Publication status	Published - Nov-2020
Event	2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Virtual, Santa Fe, United States Duration: 30-Nov-2020 → 30-Dec-2020

Publication series

Name	IEEE Radiation Effects Data Workshop
Volume	2020-November

Conference

Conference	2020 IEEE Radiation Effects Data Workshop, REDW 2020
Country/Territory	United States
City	Virtual, Santa Fe
Period	30/11/2020 → 30/12/2020

Keywords

COTS
cross section
electrons
heavy ions
high-energy protons
low-energy protons
neutrons
pions
SEU
SRAM

Access to Document

10.1109/REDW51883.2020.9325822

Handle.net

Persistent link

Embargoed Document

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
Final publisher's version, 1.61 MB
Licence: Taverne
Request copy

Cite this

Coronetti, A., Cecchetto, M., Wang, J., Tali, M., Martinez, P. F., Kastriotou, M., Papadopoulou, A., Bilko, K., Castellani, F., Sacristan, M., Alia, R. G., Cazzaniga, C., Morilla, Y., Martin-Holgado, P., Van Goethem, M. J., Kiewiet, H., van der Graaf, E., Brandenburg, S., Hajdas, W., ... Puchner, H. (2020). SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. In 2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference [9325822] (IEEE Radiation Effects Data Workshop; Vol. 2020-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/REDW51883.2020.9325822

Coronetti, Andrea ; Cecchetto, Matteo ; Wang, Jialei et al. / SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. 2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference. Institute of Electrical and Electronics Engineers Inc., 2020. (IEEE Radiation Effects Data Workshop).

@inproceedings{efa7386208e04770b952b7fbd0083df9,

title = "SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below",

abstract = "The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low-and high-energy protons, heavy ions, thermal, intermediate-and high-energy neutrons, high-energy electrons and high-energy pions.",

keywords = "COTS, cross section, electrons, heavy ions, high-energy protons, low-energy protons, neutrons, pions, SEU, SRAM",

author = "Andrea Coronetti and Matteo Cecchetto and Jialei Wang and Maris Tali and Martinez, {Pablo Fernandez} and Maria Kastriotou and Athina Papadopoulou and Kacper Bilko and Florent Castellani and Mario Sacristan and Alia, {Ruben Garcia} and Carlo Cazzaniga and Yolanda Morilla and Pedro Martin-Holgado and {Van Goethem}, {Marc Jan} and Harry Kiewiet and {van der Graaf}, Emiel and Sytze Brandenburg and Wojtek Hajdas and Laura Sinkunaite and Miroslaw Marszalek and Heikki Kettunen and Mikko Rossi and Jukka Jaatinen and Arto Javanainen and Moscatello, {Marie Helene} and Salvatore Fiore and Giulia Bazzano and Christopher Frost and Manon Letiche and Wilfrid Farabolini and Antonio Gilardi and Roberto Corsini and Helmut Puchner",

note = "Funding Information: This study has received funding from the European Union{\textquoteright}s Horizon 2020 research and innovation programme under the MSC grant agreement no. 721624 and in part by the European Space Agency (ESA/ESTEC) at the University of Jyv{\"a}skyl{\"a} under Contract 4000124504/18/NL/KML/zk. Publisher Copyright: {\textcopyright} 2020 IEEE. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.; 2020 IEEE Radiation Effects Data Workshop, REDW 2020 ; Conference date: 30-11-2020 Through 30-12-2020",

year = "2020",

month = nov,

doi = "10.1109/REDW51883.2020.9325822",

language = "English",

series = "IEEE Radiation Effects Data Workshop",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference",

}

Coronetti, A, Cecchetto, M, Wang, J, Tali, M, Martinez, PF, Kastriotou, M, Papadopoulou, A, Bilko, K, Castellani, F, Sacristan, M, Alia, RG, Cazzaniga, C, Morilla, Y, Martin-Holgado, P, Van Goethem, MJ , Kiewiet, H , van der Graaf, E , Brandenburg, S, Hajdas, W, Sinkunaite, L, Marszalek, M, Kettunen, H, Rossi, M, Jaatinen, J, Javanainen, A, Moscatello, MH, Fiore, S, Bazzano, G, Frost, C, Letiche, M, Farabolini, W, Gilardi, A, Corsini, R & Puchner, H 2020, SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. in 2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference., 9325822, IEEE Radiation Effects Data Workshop, vol. 2020-November, Institute of Electrical and Electronics Engineers Inc., 2020 IEEE Radiation Effects Data Workshop, REDW 2020, Virtual, Santa Fe, United States, 30/11/2020. https://doi.org/10.1109/REDW51883.2020.9325822

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. / Coronetti, Andrea; Cecchetto, Matteo; Wang, Jialei et al.

2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference. Institute of Electrical and Electronics Engineers Inc., 2020. 9325822 (IEEE Radiation Effects Data Workshop; Vol. 2020-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

AU - Coronetti, Andrea

AU - Cecchetto, Matteo

AU - Wang, Jialei

AU - Tali, Maris

AU - Martinez, Pablo Fernandez

AU - Kastriotou, Maria

AU - Papadopoulou, Athina

AU - Bilko, Kacper

AU - Castellani, Florent

AU - Sacristan, Mario

AU - Alia, Ruben Garcia

AU - Cazzaniga, Carlo

AU - Morilla, Yolanda

AU - Martin-Holgado, Pedro

AU - Van Goethem, Marc Jan

AU - Kiewiet, Harry

AU - van der Graaf, Emiel

AU - Brandenburg, Sytze

AU - Hajdas, Wojtek

AU - Sinkunaite, Laura

AU - Marszalek, Miroslaw

AU - Kettunen, Heikki

AU - Rossi, Mikko

AU - Jaatinen, Jukka

AU - Javanainen, Arto

AU - Moscatello, Marie Helene

AU - Fiore, Salvatore

AU - Bazzano, Giulia

AU - Frost, Christopher

AU - Letiche, Manon

AU - Farabolini, Wilfrid

AU - Gilardi, Antonio

AU - Corsini, Roberto

AU - Puchner, Helmut

N1 - Funding Information: This study has received funding from the European Union’s Horizon 2020 research and innovation programme under the MSC grant agreement no. 721624 and in part by the European Space Agency (ESA/ESTEC) at the University of Jyväskylä under Contract 4000124504/18/NL/KML/zk. Publisher Copyright: © 2020 IEEE. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

PY - 2020/11

Y1 - 2020/11

N2 - The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low-and high-energy protons, heavy ions, thermal, intermediate-and high-energy neutrons, high-energy electrons and high-energy pions.

AB - The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low-and high-energy protons, heavy ions, thermal, intermediate-and high-energy neutrons, high-energy electrons and high-energy pions.

KW - COTS

KW - cross section

KW - electrons

KW - heavy ions

KW - high-energy protons

KW - low-energy protons

KW - neutrons

KW - pions

KW - SEU

KW - SRAM

U2 - 10.1109/REDW51883.2020.9325822

DO - 10.1109/REDW51883.2020.9325822

M3 - Conference contribution

AN - SCOPUS:85100259885

T3 - IEEE Radiation Effects Data Workshop

BT - 2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2020 IEEE Radiation Effects Data Workshop, REDW 2020

Y2 - 30 November 2020 through 30 December 2020

ER -

Coronetti A, Cecchetto M, Wang J, Tali M, Martinez PF, Kastriotou M et al. SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. In 2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference. Institute of Electrical and Electronics Engineers Inc. 2020. 9325822. (IEEE Radiation Effects Data Workshop). doi: 10.1109/REDW51883.2020.9325822