SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Andrea Coronetti*, Matteo Cecchetto, Jialei Wang, Maris Tali, Pablo Fernandez Martinez, Maria Kastriotou, Athina Papadopoulou, Kacper Bilko, Florent Castellani, Mario Sacristan, Ruben Garcia Alia, Carlo Cazzaniga, Yolanda Morilla, Pedro Martin-Holgado, Marc Jan Van Goethem, Harry Kiewiet, Emiel van der Graaf, Sytze Brandenburg, Wojtek Hajdas, Laura SinkunaiteMiroslaw Marszalek, Heikki Kettunen, Mikko Rossi, Jukka Jaatinen, Arto Javanainen, Marie Helene Moscatello, Salvatore Fiore, Giulia Bazzano, Christopher Frost, Manon Letiche, Wilfrid Farabolini, Antonio Gilardi, Roberto Corsini, Helmut Puchner

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)


The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low-and high-energy protons, heavy ions, thermal, intermediate-and high-energy neutrons, high-energy electrons and high-energy pions.

Original languageEnglish
Title of host publication2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages8
ISBN (Electronic)9780738110851
Publication statusPublished - Nov-2020
Event2020 IEEE Radiation Effects Data Workshop, REDW 2020 - Virtual, Santa Fe, United States
Duration: 30-Nov-202030-Dec-2020

Publication series

NameIEEE Radiation Effects Data Workshop


Conference2020 IEEE Radiation Effects Data Workshop, REDW 2020
Country/TerritoryUnited States
CityVirtual, Santa Fe


  • COTS
  • cross section
  • electrons
  • heavy ions
  • high-energy protons
  • low-energy protons
  • neutrons
  • pions
  • SEU
  • SRAM

Cite this