Simulation of integrate-and-fire neuron circuits using HfO2-based ferroelectric field effect transistors

Bharathwaj Suresh, Martin Bertele*, Evelyn T. Breyer, Philipp Klein, Halid Mulaosmanovic, Thomas Mikolajick, Stefan Slesazeck, Elisabetta Chicca

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

9 Citations (Scopus)
65 Downloads (Pure)

Abstract

Inspired by neurobiological systems, Spiking Neural Networks (SNNs) are gaining an increasing interest in the field of bio-inspired machine learning. Neurons, as central processing and short-term memory units of biological neural systems, are thus at the forefront of cutting-edge research approaches. The realization of CMOS circuits replicating neuronal features, namely the integration of action potentials and firing according to the all-or-nothing law, imposes various challenges like large area and power consumption. The non-volatile storage of polarization states and accumulative switching behavior of nanoscale HfO2 - based Ferroelectric Field-Effect Transistors (FeFETs), promise to circumvent these issues. In this paper, we propose two FeFET-based neuronal circuits emulating the Integrate-and-Fire (IF) behavior of biological neurons on the basis of SPICE simulations. Additionally, modulating the depolarization of the FeFETs enables the replication of a biology-based concept known as membrane leakage. The presented capacitor-free implementation is crucial for the development of neuromorphic systems that allow more complex features at a given area and power constraint.

Original languageEnglish
Title of host publication2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages229-232
Number of pages4
ISBN (Electronic)9781728109961
DOIs
Publication statusPublished - Nov-2019
Event26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 - Genoa, Italy
Duration: 27-Nov-201929-Nov-2019

Conference

Conference26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019
Country/TerritoryItaly
CityGenoa
Period27/11/201929/11/2019

Keywords

  • Ferroelectric FET (FeFET)
  • Hafnium oxide
  • Integrate-and-fire (IF) neurons
  • Leaky integration
  • Neuromorphic circuits

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