Simulation of X-ray diffraction-line broadening for a material containing misfitting precipitates

T.C. Bor, R. Delhez, E.J. Mittemeijer, E. van der Giessen

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
258 Downloads (Pure)
Original languageDutch
Pages (from-to)896 - 899
Number of pages4
JournalMaterials science and engineering a-Structural materials properties microstructure and processing
Volume234
Issue number3
DOIs
Publication statusPublished - 1997

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