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Spectroscopy and structural properties of amorphous and nanocrystalline silicon carbide thin films
Sylvain Halindintwali, D. Knoesen, B.A. Julies, C.J. Arendse, T. Muller, Régis Y.N. Gengler, P. Rudolf, P.H.M. van Loosdrecht
Research output: Contribution to journal › Article › Academic
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