| Original language | English |
|---|---|
| Title of host publication | WIT Transactions on Engineering Sciences |
| Pages | 13-24 |
| Number of pages | 12 |
| Volume | 78 |
| Publication status | Published - 2013 |
Statistical analysis of SEM image noise
C. Mansilla, V. Ocelík, J.T.M. De Hosson
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic
4
Citations
(Scopus)