Strain profile and polarization enhancement in Ba0.5Sr0.5TiO3 thin films

F. Z. Amir; W. Donner; M. Aspelmeyer; Beatriz Noheda; X. X. Xi; S. C. Moss

doi:10.1002/pssa.201228176

Strain profile and polarization enhancement in Ba0.5Sr0.5TiO3 thin films

F. Z. Amir^*, W. Donner, M. Aspelmeyer, Beatriz Noheda, X. X. Xi, S. C. Moss

^*Corresponding author for this work

Zernike Institute for Advanced Materials

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

The sensitivity of spontaneous polarization to epitaxial strain for both 10 and 50 nm thick Ba0.5Sr0.5TiO3 (BSTO) ferroelectric thin films has been studied. Crystal truncation rod (CTR) profiles in the 00L directions at different wavelengths, and grazing incidence diffraction (GID) in the 0K0 direction on a single crystal have been recorded. Modeling of the CTR data gives a detailed picture of the strain and provides clear evidence of the film out-of-plane expansion at the surface, an increase of the polarization, as well as a contraction at the interface. GID data confirm the fitting of the CTR, showing an in-plane expansion of the BSTO film at the interface and a contraction at the surface. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Original language	English
Pages (from-to)	2255-2259
Number of pages	5
Journal	Physica Status Solidi A-Applications and materials science
Volume	209
Issue number	11
DOIs	https://doi.org/10.1002/pssa.201228176
Publication status	Published - Nov-2012

Keywords

BSTO
crystal truncation rod
strain
spontaneous polarization
X-RAY INTERFERENCE
SURFACE

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title = "Strain profile and polarization enhancement in Ba0.5Sr0.5TiO3 thin films",

abstract = "The sensitivity of spontaneous polarization to epitaxial strain for both 10 and 50 nm thick Ba0.5Sr0.5TiO3 (BSTO) ferroelectric thin films has been studied. Crystal truncation rod (CTR) profiles in the 00L directions at different wavelengths, and grazing incidence diffraction (GID) in the 0K0 direction on a single crystal have been recorded. Modeling of the CTR data gives a detailed picture of the strain and provides clear evidence of the film out-of-plane expansion at the surface, an increase of the polarization, as well as a contraction at the interface. GID data confirm the fitting of the CTR, showing an in-plane expansion of the BSTO film at the interface and a contraction at the surface. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim",

keywords = "BSTO, crystal truncation rod, strain, spontaneous polarization, X-RAY INTERFERENCE, SURFACE",

author = "Amir, {F. Z.} and W. Donner and M. Aspelmeyer and Beatriz Noheda and Xi, {X. X.} and Moss, {S. C.}",

year = "2012",

month = nov,

doi = "10.1002/pssa.201228176",

language = "English",

volume = "209",

pages = "2255--2259",

journal = "Physica Status Solidi A-Applications and materials science",

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TY - JOUR

T1 - Strain profile and polarization enhancement in Ba0.5Sr0.5TiO3 thin films

AU - Amir, F. Z.

AU - Donner, W.

AU - Aspelmeyer, M.

AU - Noheda, Beatriz

AU - Xi, X. X.

AU - Moss, S. C.

PY - 2012/11

Y1 - 2012/11

N2 - The sensitivity of spontaneous polarization to epitaxial strain for both 10 and 50 nm thick Ba0.5Sr0.5TiO3 (BSTO) ferroelectric thin films has been studied. Crystal truncation rod (CTR) profiles in the 00L directions at different wavelengths, and grazing incidence diffraction (GID) in the 0K0 direction on a single crystal have been recorded. Modeling of the CTR data gives a detailed picture of the strain and provides clear evidence of the film out-of-plane expansion at the surface, an increase of the polarization, as well as a contraction at the interface. GID data confirm the fitting of the CTR, showing an in-plane expansion of the BSTO film at the interface and a contraction at the surface. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

AB - The sensitivity of spontaneous polarization to epitaxial strain for both 10 and 50 nm thick Ba0.5Sr0.5TiO3 (BSTO) ferroelectric thin films has been studied. Crystal truncation rod (CTR) profiles in the 00L directions at different wavelengths, and grazing incidence diffraction (GID) in the 0K0 direction on a single crystal have been recorded. Modeling of the CTR data gives a detailed picture of the strain and provides clear evidence of the film out-of-plane expansion at the surface, an increase of the polarization, as well as a contraction at the interface. GID data confirm the fitting of the CTR, showing an in-plane expansion of the BSTO film at the interface and a contraction at the surface. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

KW - BSTO

KW - crystal truncation rod

KW - strain

KW - spontaneous polarization

KW - X-RAY INTERFERENCE

KW - SURFACE

U2 - 10.1002/pssa.201228176

DO - 10.1002/pssa.201228176

M3 - Article

SN - 1862-6300

VL - 209

SP - 2255

EP - 2259

JO - Physica Status Solidi A-Applications and materials science

JF - Physica Status Solidi A-Applications and materials science

IS - 11

ER -

Strain profile and polarization enhancement in Ba0.5Sr0.5TiO3 thin films

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Keywords

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