Surface Reconstruction-Induced Coincidence Lattice Formation Between Two-Dimensionally Bonded Materials and a Three-Dimensionally Bonded Substrate

Jos E. Boschker*, Jamo Momand, Valeria Bragaglia, Ruining Wang, Karthick Perumal, Alessandro Giussani, Bart J. Kooi, Henning Riechert, Raffaella Calarco

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

51 Citations (Scopus)

Abstract

Sb2Te3 films are used for studying the epitaxial registry between two-dimensionally bonded (2D) materials and three-dimensional bonded (3D) substrates. In contrast to the growth of 3D materials, it is found that the formation of coincidence lattices between Sb2Te3 and Si(111) depends on the geometry and dangling bonds of the reconstructed substrate surface. Furthermore, we show that the epitaxial registry can be influenced by controlling the Si(111) surface reconstruction and confirm the results for ultrathin films.

Original languageEnglish
Pages (from-to)3534-3538
Number of pages5
JournalNano Letters
Volume14
Issue number6
DOIs
Publication statusPublished - Jun-2014

Keywords

  • Coincidence lattices
  • van der Waals epitaxy
  • 2D materials
  • topological insulators
  • phase change materials
  • surface reconstructions
  • ENERGY ELECTRON-DIFFRACTION
  • MOLECULAR-BEAM EPITAXY
  • THIN-FILM GROWTH
  • SB
  • SI(111)
  • BI2SE3

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